November 14, 2010
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Ebook Download Industrial X-Ray Computed Tomography
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Industrial X-Ray Computed Tomography
Ebook Download Industrial X-Ray Computed Tomography
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From the Back Cover
This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
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About the Author
Simone Carmignato is Professor of Manufacturing Engineering and Manufacturing Metrology at the University of Padua, Italy. His research activities are in the area of precision engineering and dimensional metrology, with focus on industrial computed tomography and advanced coordinate metrology. In 2012, he was awarded the F. W. Taylor Medal from CIRP, the International Academy for Production Engineering.Wim Dewulf holds a Professorship in the Department of Mechanical Engineering at KU Leuven, Belgium, where he is leading research groups on Sustainable Engineering and on Dimensional Metrology. In the latter field, his major research themes include X-ray computed tomography, multi-sensor metrology, and automated inspection planning. He was, amongst others, coordinating the highly successful INTERAQCT project, which provided an extensive industrial-academic training environment for young researchers in the field of X-ray CT metrology. Richard Leach is Chair in Metrology at The University of Nottingham, UK, and heads up the Manufacturing Metrology Team. Richard’s current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, development of methods for controlling large surfaces to high resolution in industrial applications and x-ray computed tomography. Â
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Product details
Hardcover: 369 pages
Publisher: Springer; 1st ed. 2018 edition (October 20, 2017)
Language: English
ISBN-10: 3319595717
ISBN-13: 978-3319595719
Product Dimensions:
6.1 x 0.9 x 9.2 inches
Shipping Weight: 1.5 pounds (View shipping rates and policies)
Average Customer Review:
4.0 out of 5 stars
2 customer reviews
Amazon Best Sellers Rank:
#1,033,575 in Books (See Top 100 in Books)
This book is a good resource if you're wanting to learn more about industrial CT scanning. It covers a wide range of topics and is easy to read. I do wish that there was an index, though. Also, I occasionally found myself wanting more information on specific subjects.
It is the first book on the subject of CT scanning for nondestructive evaluation of industrial components and material analysis (metrology, identification and location of internal features such as unwanted inclusions or defects, etc.), therefore, a good reference. It is very rare to find a book in the topic of X-ray CT that is non medical focused, which is a plus.
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